A NEW PROBE OF THE OPTICAL-PROPERTIES OF SURFACES

被引：30

作者：

OLMSTEAD, MA

AMER, NM

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1983年 / 1卷 / 03期

关键词：

D O I：

10.1116/1.582686

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：751 / 755

页数：5

共 10 条

[1]

Chiarotti G, 1981, RECENT DEV CONDENSED, V1, P633

[2]

EASTMAN DE, 1980, J VAC SCI TECHNOL, V17, P492, DOI 10.1116/1.570492

[3]

FAUSTER T, 1982, SURF SCI, V117, P387

[4] SEMICONDUCTOR SURFACE-STATE SPECTROSCOPY [J].

GUICHAR, GM ;

BALKANSKI, M ;

SEBENNE, CA .

SURFACE SCIENCE, 1979, 86 (JUL) :874-887

[5] OPTICAL SPECTROSCOPY OF ELECTRONIC SURFACE STATES [J].

LUTH, H .

APPLIED PHYSICS, 1975, 8 (01) :1-14

[6] DIFFERENTIAL REFLECTION SPECTROSCOPY OF VERY THIN SURFACE FILMS [J].

MCINTYRE, JD ;

ASPNES, DE .

SURFACE SCIENCE, 1971, 24 (02) :417-&

[7]

OLMSTEAD MA, UNPUB APPL PHYS A

[8]

OLMSTEAD MA, 1982, B AM PHYS SOC, V27, P227

[9] OPTICAL CONSTANTS OF SILVER, GOLD, COPPER, AND ALUMINUM .2. THE INDEX OF REFRACTION-N [J].

SCHULZ, LG ;

TANGHERLINI, FR .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (05) :362-368

[10] THE OPTICAL CONSTANTS OF SILVER, GOLD, COPPER, AND ALUMINUM .1. THE ABSORPTION COEFFICIENT-K [J].

SCHULZ, LG .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (05) :357-362

← 1 →