DEVICE DEGRADATION AND RECOMBINATION ENHANCED DEFECT PROCESSES IN III-V SEMICONDUCTORS

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作者：
PETROFF, PM
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SEMICONDUCTORS AND INSULATORS | 1983年 / 5卷 / 3-4期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：307 / 319
页数：13
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