ELECTRON-BEAM TEST SYSTEM FOR HIGH-SPEED DEVICES

被引：15
|
作者：
BRUNNER, M [1 ]
WINKLER, D [1 ]
SCHMITT, R [1 ]
LISCHKE, B [1 ]
机构：
[1] UNIV TUBINGEN,INST ANGEW PHYS,D-7400 TUBINGEN 1,FED REP GER
来源：
SCANNING | 1987年 / 9卷 / 05期
关键词：
D O I：
10.1002/sca.4950090504
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：201 / 204
页数：4
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