STRUCTURE-ANALYSIS OF CRYSTALS AND THEIR DEFECTS BY HREM

被引：1
作者：
BURSILL, LA
机构：
来源：
MICRON | 1982年 / 13卷 / 03期
关键词：
D O I：
10.1016/0047-7206(82)90001-2
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：241 / 244
页数：4
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