ELECTRIC-FIELDS INDUCED IN ALKALI-CONTAINING GLASSES BY ELECTRON-IRRADIATION

被引：2

作者：

MIOTELLO, A ^{[1
]}

机构：

[1] IST RIC SCI & TECNOL,I-38050 POVO,ITALY

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1986年 / 19卷 / 10期

关键词：

D O I：

10.1088/0022-3719/19/10/002

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：L201 / L206

页数：6

共 9 条

[1] NUMERICAL-ANALYSIS OF FIELD-ASSISTED SODIUM MIGRATION IN ELECTRON-IRRADIATED GLASSES [J].

MIOTELLO, A ;

MAZZOLDI, P .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1982, 15 (27) :5615-5621

[2] COOPERATIVE TRANSPORT EFFECTS IN ELECTRON-IRRADIATED GLASSES [J].

MIOTELLO, A ;

MAZZOLDI, P .

PHYSICAL REVIEW LETTERS, 1985, 54 (15) :1675-1678

[3] MOBILITY AND SURFACE RECOMBINATION PROCESSES OF PRIMARY ELECTRONS IN DIELECTRIC SYSTEMS DURING AUGER-ELECTRON SPECTROSCOPY [J].

MIOTELLO, A .

PHYSICS LETTERS A, 1984, 103 (05) :279-282

[4] A NOTE ON ENHANCED DIFFUSION AND DESORPTION PROCESSES IN ELECTRON-IRRADIATED GLASSES [J].

MIOTELLO, A .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (04) :445-452

[5] ALKALI SIGNAL DECAY DURING AUGER ANALYSIS OF DIELECTRIC SOLIDS - SECONDARY EFFECT OF DESORPTION PROCESS [J].

MIOTELLO, A ;

MAZZOLDI, P .

RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1984, 83 (3-4) :271-277

[6] GENERAL-MODEL OF SODIUM DESORPTION AND DIFFUSION DURING ELECTRON-BOMBARDMENT OF GLASS [J].

OHUCHI, F ;

HOLLOWAY, PH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03) :863-867

[7] ELECTRON-BEAM DAMAGE IN AUGER-ELECTRON SPECTROSCOPY [J].

PANTANO, CG ;

MADEY, TE .

APPLIED SURFACE SCIENCE, 1981, 7 (1-2) :115-141

[8] SODIUM-ION MIGRATION IN GLASS ON ELECTRON-BEAM IRRADIATION [J].

USHER, DM .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (14) :2039-2048

[9] ELECTRON TRAPPING IN AMORPHOUS SIO2 STUDIED BY CHARGE BUILDUP UNDER ELECTRON-BOMBARDMENT [J].

VIGOUROUX, JP ;

DURAUD, JP ;

LEMOEL, A ;

LEGRESSUS, C ;

GRISCOM, DL .

JOURNAL OF APPLIED PHYSICS, 1985, 57 (12) :5139-5144

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