ORGANOMETALLIC CHEMICAL VAPOR-DEPOSITED LAYERS OF STABILIZED ZIRCONIA ON SAPPHIRE AS A SUBSTRATE FOR LASER ABLATED YBA2CU3O7-X THIN-FILMS

被引:18
作者
SCHIEBER, M
SCHWARTZ, M
KOREN, G
AHARONI, E
机构
[1] XSIRIUS SUPERCOND INC,SCOTTSDALE,AZ 85260
[2] XSIRIUS SUPERCOND MAT LTD,IL-91030 JERUSALEM,ISRAEL
[3] TECHNION ISRAEL INST TECHNOL,DEPT PHYS,IL-32000 HAIFA,ISRAEL
关键词
D O I
10.1063/1.104668
中图分类号
O59 [应用物理学];
学科分类号
摘要
Substrates of (1102BAR1) sapphire single crystals were covered with Y2O3 stabilized ZrO2 (YSZ) thin films deposited from 2,2,6,6 tetramethyl-3, 5-heptanedione precursors of Zr and Y by organometallic chemical vapor deposition. The YSZ layers were indeed oriented on the (100) planes as established by x-ray diffraction. Thin films of YBa2Cu3O7-x (YBCO) were then deposited on top of the YSZ layer by laser ablation. A critical temperature (R = 0) of 90 K was obtained which is among the highest observed for YSZ. However, the critical current density at 77 K was only of the order of 10(3) A/cm2, which is common of polycrystalline YBCO deposited on YSZ.
引用
收藏
页码:301 / 303
页数:3
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