X-RAY ABSORPTION-SPECTROSCOPY IN DISPERSIVE MODE AND BY TOTAL REFLECTION

被引:25
作者
DARTYGE, E [1 ]
FONTAINE, A [1 ]
TOURILLON, G [1 ]
CORTES, R [1 ]
JUCHA, A [1 ]
机构
[1] UNIV PARIS 06, PHYS LIQUIDES & ELECTROCHIM LAB, F-75005 PARIS, FRANCE
关键词
D O I
10.1016/0375-9601(86)90051-4
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:384 / 388
页数:5
相关论文
共 19 条
[1]  
BOSIO L, 1984, J ELECTROANAL CHEM, V180, P265, DOI 10.1016/0368-1874(84)83585-6
[2]   EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111) [J].
CITRIN, PH ;
EISENBERGER, P ;
HEWITT, RC .
PHYSICAL REVIEW LETTERS, 1978, 41 (05) :309-312
[3]   ADSORPTION SITES AND BOND LENGTHS OF IODINE ON CU(111) AND CU(100) FROM SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J].
CITRIN, PH ;
EISENBERGER, P ;
HEWITT, RC .
PHYSICAL REVIEW LETTERS, 1980, 45 (24) :1948-1951
[4]  
DARTYGE E, 1984, SPRINGER P PHYSICS, V2, P472
[5]  
DARTYGE E, 1985, UNPUB NUCL INSTRUM M
[6]   EXTENDED X-RAY ABSORPTION FINE STRUCTURE IN DISPERSIVE MODE. [J].
Flank, A.M. ;
Fontaine, A. ;
Jucha, A. ;
Lemonnier, M. ;
Williams, C. .
1600, (43)
[7]   EXAFS IN DISPERSIVE MODE [J].
FLANK, AM ;
FONTAINE, A ;
JUCHA, A ;
LEMONNIER, M ;
RAOUX, D ;
WILLIAMS, C .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3) :651-654
[8]   ON EXPERIMENTAL ATTENUATION FACTORS OF THE AMPLITUDE OF THE EXAFS OSCILLATIONS IN ABSORPTION, REFLECTIVITY AND LUMINESCENCE MEASUREMENTS [J].
GOULON, J ;
GOULONGINET, C ;
CORTES, R ;
DUBOIS, JM .
JOURNAL DE PHYSIQUE, 1982, 43 (03) :539-548
[9]  
HEALD SM, 1984, PHYS LETT A, V103, P155, DOI 10.1016/0375-9601(84)90224-X
[10]   EXAFS STUDIES ON SUPERFICIAL REGIONS BY MEANS OF TOTAL REFLECTION [J].
MARTENS, G ;
RABE, P .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 58 (02) :415-424