THE STRUCTURE AND COMPOSITION OF TE/CDS THIN-FILM DIODES

被引：1

作者：

FITZGERALD, AG

机构：

[1] Univ of Dundee, Dundee, Scotl, Univ of Dundee, Dundee, Scotl

来源：

THIN SOLID FILMS | 1987年 / 149卷 / 03期

关键词：

CRYSTALS - Structure - ELECTRONS - Diffraction - SEMICONDUCTING CADMIUM COMPOUNDS - Thin Films - SPECTROSCOPY; AUGER ELECTRON - TELLURIUM - Thin Films;

D O I：

10.1016/0040-6090(87)90395-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The composition and crystal structure of the interfacial region in thin film Te/CdS heterojunctions were investigated using Auger electron spectroscopy and reflection electron diffraction. The junction region is found to contain a thin CdTe layer accompanied by a graded layer of composition CdTe//xS//1// minus //x.

引用

页码：325 / 330

页数：6