THE STRUCTURE AND COMPOSITION OF TE/CDS THIN-FILM DIODES

被引：1
|
作者：
FITZGERALD, AG
机构：
[1] Univ of Dundee, Dundee, Scotl, Univ of Dundee, Dundee, Scotl
来源：
THIN SOLID FILMS | 1987年 / 149卷 / 03期
关键词：
CRYSTALS - Structure - ELECTRONS - Diffraction - SEMICONDUCTING CADMIUM COMPOUNDS - Thin Films - SPECTROSCOPY; AUGER ELECTRON - TELLURIUM - Thin Films;
D O I：
10.1016/0040-6090(87)90395-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The composition and crystal structure of the interfacial region in thin film Te/CdS heterojunctions were investigated using Auger electron spectroscopy and reflection electron diffraction. The junction region is found to contain a thin CdTe layer accompanied by a graded layer of composition CdTe//xS//1// minus //x.
引用
收藏
页码：325 / 330
页数：6
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