EFFECT OF BIAS ON RADIATION-INDUCED PARAMAGNETIC DEFECTS AT THE SILICON-SILICON DIOXIDE INTERFACE

被引：121
作者：
LENAHAN, PM
DRESSENDORFER, PV
机构：
来源：
APPLIED PHYSICS LETTERS | 1982年 / 41卷 / 06期
关键词：
D O I：
10.1063/1.93583
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：542 / 544
页数：3
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