DIRECT MEASUREMENT OF THE ENERGY-DISTRIBUTION OF HOT-ELECTRONS IN SILICON DIOXIDE

被引：103
作者：
BRORSON, SD [1 ]
DIMARIA, DJ [1 ]
FISCHETTI, MV [1 ]
PESAVENTO, FL [1 ]
SOLOMON, PM [1 ]
DONG, DW [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1985年 / 58卷 / 03期
关键词：
D O I：
10.1063/1.336098
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1302 / 1313
页数：12
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