X-RAY INTERFERENCE FRINGES IN BERG-BARRETT MICROGRAPHS

被引:6
作者
ARMSTRONG, RW
SCHULTZ, JM
机构
关键词
D O I
10.1107/S0365110X64003139
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:1214 / &
相关论文
共 12 条
[1]   *DIE ABSORPTION VON RONTGENSTRAHLEN IM FALL DER INTERFERENZ [J].
BORRMANN, G .
ZEITSCHRIFT FUR PHYSIK, 1950, 127 (04) :297-323
[2]  
Borrmann G, 1941, PHYS Z, V42, P157
[3]   ANOMALOUS ELECTRON ABSORPTION EFFECTS IN METAL FOILS - THEORY AND COMPARISON WITH EXPERIMENT [J].
HASHIMOTO, H ;
HOWIE, A ;
WHELAN, MJ .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1962, 269 (1336) :80-&
[4]  
JAMES RW, 1953, OPTICAL PRINCIPLES D, P27
[5]   A STUDY OF PENDELLOSUNG FRINGES IN X-RAY DIFFRACTION [J].
KATO, N ;
LANG, AR .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (10) :787-&
[6]   X-RAY OBSERVATIONS OF LATTICE DEFECTS IN PARTICULAR, STACKING FAULTS IN NEIGHBOURHOOD OF A TWIN BOUNDARY IN SILICON SINGLE CRYSTALS [J].
KOHRA, K ;
YOSHIMATSU, M .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1962, 17 (06) :1041-&
[7]  
MERLINI A, 1961, PRIVATE COMMUNICATIO
[8]   METHOD FOR THE DETECTION OF DISLOCATIONS IN SILICON BY X-RAY EXTINCTION CONTRAST [J].
NEWKIRK, JB .
PHYSICAL REVIEW, 1958, 110 (06) :1465-1466
[9]  
NEWKIRK JB, 1959, T AM I MIN MET ENG, V215, P483
[10]  
SCHULTZ JM, 1962, DIRECT OBSERVATION I, P569