ON A GENERAL IMPERFECT DEBUGGING SOFTWARE-RELIABILITY GROWTH-MODEL

被引:0
|
作者
KAPUR, PK [1 ]
AGARWALA, S [1 ]
YOUNES, S [1 ]
SINHA, AK [1 ]
机构
[1] UNIV DELHI,DEPT COMP SCI,DELHI 110007,INDIA
来源
MICROELECTRONICS AND RELIABILITY | 1994年 / 34卷 / 08期
关键词
D O I
10.1016/0026-2714(94)90159-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several software reliability growth models (SRGMs) based on non-homogeneous Poisson process (NHPP) have been proposed in the literature which are suited only in a particular perfectly debugging environment. None of the existing models is flexible enough in the sense of being suitable under different testing environment. Moreover, there is hardly any SRGM which is developed to cater for an imperfect debugging environment. Therefore, it is important to develop models which are not only flexible but are also suited under imperfect debugging environment. In this paper, we propose an SRGM with imperfect fault detection in which the software faults (errors) detected during testing have been categorized into three classes, namely, minor, major and critical, depending on the severity of the faults. The application of the proposed model has been shown by applying it to different actual data sets. It is further compared with the other imperfect SRGMs in terms of goodness of fit.
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页码:1397 / 1403
页数:7
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