METAL POLYIMIDE INTERFACES CHARACTERIZED BY SECONDARY ION MASS-SPECTROSCOPY

被引：0

作者：

FURMAN, BK

PURUSHOTHAMAN, S

CASTELLANI, E

RENICK, S

NEUGROSHL, D

机构：

来源：

ACS SYMPOSIUM SERIES | 1990年 / 440卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：297 / 311

页数：15

共 8 条

[1]

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[8] PACKAGING TECHNOLOGY FOR THE NEC-SX SUPERCOMPUTER [J].

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