FAST REFRACTOMETER FOR EVAPORATED THIN-FILMS

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作者：

VANDERWAL, J ^{[1
]}

机构：

[1] PHILIPS RES LABS, EINDHOVEN, NETHERLANDS

来源：

PHILIPS TECHNICAL REVIEW | 1975年 / 35卷 / 05期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：142 / 143

页数：2

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