FAR-INFRARED EMBEDDING IMPEDANCE MEASUREMENTS

被引：1
|
作者：
NEIKIRK, DP
RUTLEDGE, DB
机构：
来源：
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 1984年 / 5卷 / 07期
关键词：
D O I：
10.1007/BF01009590
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：1017 / 1026
页数：10
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