CHARACTERIZATION OF THIN BISRCACUO SUPERCONDUCTING FILMS

In this paper, we review the main properties of BiSrCaCuO thin films obtained by laser ablation followed by a post deposition oxygen annealing treatment. These properties were investigated by the complementary use of Rutherford backscattering spectrometry, X-ray diffraction, scanning electron microscopy, Raman microprobe analysis, X-ray photoelectron spectroscopy and resistivity measurements. The high temperature annealing treatment was found to be the important parameter for obtaining superconducting transitions, ie. growth of the superconducting Bi2Sr2Ca1O8 phase. However, this treatment also induces large modifications in the films, in general the formation of a multiphased material with appreciable surface roughness of the film. We discuss in this paper the precise influence of the post deposition high temperature oxygen annealing treatment on the atomic composition, surface morphology, structural and chemical nature of the films and on their electrical properties.