ANALYSIS OF HIGH-TEMPERATURE SUPERCONDUCTING FILMS BY X-RAY-FLUORESCENCE ANALYSIS

被引：5

作者：

KLIMENT, V

机构：

[1] Institute of Physics, Slovak Academy of Sciences, Bratislava, 842 28

来源：

JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-LETTERS | 1991年 / 155卷 / 02期

关键词：

D O I：

10.1007/BF02165062

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Radionuclide X-ray fluorescence analysis was used for the determination of Cu, Y and Ba in very thin high-temperature superconducting films. The precision of the method is better than 3% for about 1-mu-m thick films. The atomic emission ICP spectrometry was used to testify results of XRF analysis. An acceptable agreement of both methods was obtained.

引用

页码：91 / 95

页数：5

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