CONFERENCE TO EXPLORE NEW METHODS FOR TESTING VLSI CIRCUITS

被引：0
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作者：
MILNE, B
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来源：
ELECTRONIC DESIGN | 1983年 / 31卷 / 21期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：46 / 46
页数：1
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