PRECISION MEASUREMENT OF LATTICE IMPERFECTIONS WITH A PHOTOGRAPHIC 2-CRYSTAL METHOD

被引：10

作者：

BEARDEN, JA

HENINS, A

机构：

来源：

关键词：

D O I：

10.1063/1.1719566

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：334 / &

共 23 条

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BEARDEN, JA
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[2] PRECISION REDETERMINATION OF STANDARD REFERENCE WAVELENGTHS FOR X-RAY SPECTROSCOPY
BEARDEN, JA
THOMSEN, JS
HENINS, A
SAUDER, WC
MARZOLF, JG
[J]. PHYSICAL REVIEW, 1964, 135 (4A): : A899 - +
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[10] COMPTON AH, 1935, X RAYS THEORY EXPERI, P739