TIME DOMAIN CAD AND MEASUREMENTS OF LOSSY COUPLED LINES

被引：0
作者：
ZOUNON, A
CROZAT, P
ADDE, R
机构：
[1] Institut d’Electronique Fondamentale, Université Paris Sud, URA22 du CNRS, Bât. 220
来源：
ELECTRONICS LETTERS | 1990年 / 26卷 / 07期
关键词：
Circuit design; Gigabit logic; Lossy coupled lines; Microstrip lines; Time domain modelling;
D O I：
10.1049/el:19900307
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A model of multiple lossy microstrip lines on IC chips or cards is developed for direct time domain simulation of interconnections at a low computational cost. It is concerned with lines of equal widths with losses independent of frequency. Measurements of the step response in the tens of picoseconds range of three coupled lines on GaAs validate the model in severe test conditions of strong ohmic losses. © 1990, The Institution of Electrical Engineers. All rights reserved.
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页码：473 / 474
页数：2
相关论文
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