PAT-REC-DE CODE - EVALUATION OF COMMON MODE FAILURES IMPACT ON RELIABILITY

被引：0

作者：

BLIN, A ^{[1
]}

CARNINO, A ^{[1
]}

JUBAULT, G ^{[1
]}

MOLLARD, C ^{[1
]}

机构：

[1] COMM ENERGIE ATOM,PARIS,FRANCE

来源：

TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | 1975年 / 20卷 / APR21期

关键词：

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：459 / 461

页数：3

共 21 条

[1] MODELLING COMMON MODE FAILURES IN THE RELIABILITY EVALUATION OF POWER SYSTEM NETWORKS.
Allan, R.N.
Dialynas, E.N.
Homer, I.R.
1979,
[2] MODELING COMMON-MODE FAILURES IN THE RELIABILITY EVALUATION OF POWER-SYSTEM NETWORKS
ALLAN, RN
DIALYNAS, EN
HOMER, IR
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1979, 98 (04): : 1142 - 1142
[3] The impact of diversity upon common mode failures
Littlewood, B
RELIABILITY ENGINEERING & SYSTEM SAFETY, 1996, 51 (01) : 101 - 113
[4] Impact of diversity upon common mode failures
City Univ, London, United Kingdom
Reliab Eng Syst Saf, 1 (101-113):
[5] Evaluation of hurricane impact on composite power system reliability considering common-cause failures
Liu Y.
Singh C.
International Journal of System Assurance Engineering and Management, 2010, 1 (02) : 135 - 145
[6] EFFECT OF A CERTAIN CLASS OF POTENTIAL COMMON MODE FAILURES ON RELIABILITY OF REDUNDANT SYSTEMS
APOSTOLAKIS, GE
NUCLEAR ENGINEERING AND DESIGN, 1976, 36 (01) : 123 - 133
[7] RELIABILITY MODELING OF TMR COMPUTER-SYSTEMS WITH REPAIR AND COMMON-MODE FAILURES
SINGH, C
MICROELECTRONICS AND RELIABILITY, 1981, 21 (02): : 259 - 262
[8] Reliability evaluation of standby safety systems due to independent and common cause failures
Lu, Lixuan
Lewis, Gregory
2006 IEEE INTERNATIONAL CONFERENCE ON AUTOMATION SCIENCE AND ENGINEERING, VOLS 1 AND 2, 2006, : 264 - +
[9] Reliability assessment of N-version software fault tolerant system with common mode failures
Jain M.
Gupta R.
OPSEARCH, 2014, 51 (4) : 533 - 544
[10] EVALUATION OF SYSTEM RELIABILITY WITH COMMON-CAUSE FAILURES, BY A PSEUDO-ENVIRONMENTS MODEL
YUAN, J
LAI, MT
KO, KL
IEEE TRANSACTIONS ON RELIABILITY, 1989, 38 (03) : 328 - 332

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