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- [2] PLASMA-GROWN OXIDE ON GAAS - SEMI-QUANTITATIVE CHEMICAL DEPTH PROFILES OBTAINED USING AUGER-SPECTROSCOPY AND NEUTRON-ACTIVATION ANALYSISJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : 481 - 487CHANG, CCCHANG, RPHMURARKA, SP
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- [4] EFFECT OF ELECTRON EJECTION DEPTH ON QUANTITATIVE-ANALYSIS BY AUGER-SPECTROSCOPYRADIOTEKHNIKA I ELEKTRONIKA, 1976, 21 (03): : 589 - 593MITYAGIN, AYPANTELEEV, VVCHEREVATSKII, NY
- [5] NONDESTRUCTIVE DETERMINATION OF COMPOSITION DEPTH PROFILES ON SUBNANOMETER SCALES USING ANGLE RESOLVED AUGER-SPECTROSCOPYJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2826 - 2831DERRY, GNVANDERLINDE, WE
- [6] CHEMICAL-COMPOSITION OF GAAS OXIDE LAYERS BY AUGER IN-DEPTH PROFILES AND X-RAY PHOTOELECTRON-SPECTROSCOPY EXPERIMENTSSCANNING MICROSCOPY, 1994, 8 (04) : 979 - 986BRESSE, JFCARDINAUD, C
- [8] DETERMINATION OF THE DEPTH RESOLUTION OF AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF ANODIC BARRIER OXIDE-FILMS ON DIFFERENTLY PRETREATED ALUMINUM SUBSTRATESSURFACE AND INTERFACE ANALYSIS, 1994, 22 (1-12) : 175 - 180DELAET, JDEBOECIK, KTERRYN, HVEREECKEN, J
- [9] CHEMICAL INFORMATION OBTAINED FROM AUGER DEPTH PROFILES BY MEANS OF ADVANCED FACTOR-ANALYSIS (MLCFA)APPLIED SURFACE SCIENCE, 1993, 64 (01) : 41 - 57DEVOLDER, PHOOGEWIJS, RDEGRYSE, RFIERMANS, LVENNIK, J
- [10] A STUDY OF THE OXIDE-SOLUTION INTERFACE USING NEUTRON-ACTIVATION ANALYSIS AND ELECTROPHORESISJOURNAL OF RADIOANALYTICAL CHEMISTRY, 1982, 72 (1-2): : 515 - 526JAFFREZICRENAULT, NKARISA, NTRANG, DH