SURFACE-ANALYSIS WITH AUGER-ELECTRON SPECTROSCOPY

被引：35
作者：
GRANT, JT
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APPLICATIONS OF SURFACE SCIENCE | 1982年 / 13卷 / 1-2期
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D O I：
10.1016/0378-5963(82)90016-2
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页码：35 / 62
页数：28
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共 148 条
[1]  
Auger P, 1923, CR HEBD ACAD SCI, V177, P169
[2]  
Auger P., 1926, ANN PHYS-PARIS, V6, P183, DOI 10.1051/anphys/192610060183
[3]   EXTENSION OF ELECTRON-PROMOTION MODEL TO ASYMMETRIC ATOMIC COLLISION [J].
BARAT, M ;
LICHTEN, W .
PHYSICAL REVIEW A, 1972, 6 (01) :211-&
[4]   AUGER-ELECTRON SPECTROSCOPIC STUDY OF SURFACE POISONING OF COPPER CATALYSTS [J].
BHASIN, MM .
JOURNAL OF CATALYSIS, 1974, 34 (03) :356-359
[5]  
BROWMAN R, 1973, VACUUM, V23, P163
[6]   EFFECTS OF ELECTRON-BOMBARDMENT DURING AUGER-ELECTRON ANALYSIS OF CORRODED METAL-SURFACES [J].
BURSTEIN, GT .
MATERIALS SCIENCE AND ENGINEERING, 1980, 42 (1-2) :207-214
[7]   APPLICATION OF DECONVOLUTION METHODS IN ELECTRON-SPECTROSCOPY - REVIEW [J].
CARLEY, AF ;
JOYNER, RW .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (1-2) :1-23
[8]   UTILITY OF BREMSSTRAHLUNG-INDUCED AUGER PEAKS [J].
CASTLE, JE ;
WEST, RH .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (03) :195-197
[9]   CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD [J].
CHANG, CC .
SURFACE SCIENCE, 1970, 23 (02) :283-&
[10]   CHEMICAL EFFECTS IN OXYGEN AUGER-SPECTRA [J].
CHESTERS, MA ;
HOPKINS, BJ ;
TAYLOR, PA .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1976, 9 (12) :L329-L331
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