MEASUREMENT OF HIGH-ORDER OPTICAL NONLINEAR SUSCEPTIBILITIES IN SEMICONDUCTOR-DOPED GLASSES

被引：73

作者：

ACIOLI, LH

GOMES, ASL

LEITE, JRR

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 53卷 / 19期

关键词：

D O I：

10.1063/1.99781

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1788 / 1790

页数：3

共 19 条

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[5]

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ALFANO, RR .

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[7] NON-LINEAR SPECTROSCOPY OF BIEXCITONS IN CUCL BY RESONANT COHERENT SCATTERING [J].

MARUANI, A ;

OUDAR, JL ;

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[8] BAND-GAP-RESONANT NON-LINEAR REFRACTION IN III-V SEMICONDUCTORS [J].

MILLER, DAB ;

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SMITH, SD .

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[9]

NAYAFI SI, 1988, APPL OPT, V27, P806

[10] FEMTOSECOND CARRIER RELAXATION IN SEMICONDUCTOR-DOPED GLASSES [J].

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APPLIED PHYSICS LETTERS, 1986, 49 (25) :1717-1719

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