ON THE RENORMALIZATION OF THE S-PARAMETER

被引:2
|
作者
AOKI, S
机构
[1] Institute of Physics, University of Tsukuba, Tsukuba, Ibaraki
关键词
D O I
10.1016/0370-2693(92)91400-4
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We calculate the bare S parameter of the standard model at one loop of fermions, using three different regularizations (dimensional, Pauli-Villars and lattice) and find an extra contribution to the bare S parameter besides the standard one for each case. This shows that the extra contribution recently reported for the lattice regularization is not necessarily tied to the non-decoupling effect of fermion doublers.
引用
收藏
页码:437 / 440
页数:4
相关论文
共 50 条
  • [21] Tracking advances in pulsed S-parameter measurements
    Betts, Loren
    MICROWAVES & RF, 2007, 46 (09) : 61 - +
  • [22] Probe-tone S-parameter measurements
    Martens, J
    Kapetanic, P
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2002, 50 (09) : 2076 - 2082
  • [23] System Simplifies Multiport S-Parameter Measurements
    Salvesen, Howard
    MICROWAVES & RF, 2009, 48 (05) : 67 - +
  • [24] Unilateral amplifier S-parameter extraction technique
    Ching, KS
    Miyamoto, RY
    Shiroma, WA
    2005 IEEE/ACES International Conference on Wireless Communications and Applied Computational Electromagnetics, 2005, : 787 - 790
  • [25] Multipole and S-parameter Based Antenna Model
    Haynes, Mark
    Moghaddam, Mahta
    2010 IEEE ANTENNAS AND PROPAGATION SOCIETY INTERNATIONAL SYMPOSIUM, 2010,
  • [26] Uncertainty Evaluation of Balanced S-Parameter Measurements
    Ziade, F.
    Hudlicka, M.
    Salter, M.
    Pavlicek, T.
    Allal, D.
    2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016), 2016,
  • [27] Pulsed S-parameter measurements: on resolution, and uncertainty
    Martens, J.
    2013 IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONICS SYSTEMS (IEEE COMCAS 2013), 2013,
  • [28] Comparison of S-Parameter Measurement Methods for Adapters
    Kuhlmann, Karsten
    Gellersen, Frauke
    Tschauder, Meike
    ADVANCES IN RADIO SCIENCE, 2023, 20 : 1 - 8
  • [29] TRACEABILITY FOR ON-WAFER S-PARAMETER MEASUREMENTS
    BANNISTER, DJ
    PERKINS, M
    IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY, 1992, 139 (05): : 232 - 234
  • [30] A lower bound for S-parameter for Walking Technicolor
    Ignjatovic, Sinisa R.
    FORTSCHRITTE DER PHYSIK-PROGRESS OF PHYSICS, 2008, 56 (4-5): : 452 - 455