ON THE RENORMALIZATION OF THE S-PARAMETER

被引:2
|
作者
AOKI, S
机构
[1] Institute of Physics, University of Tsukuba, Tsukuba, Ibaraki
关键词
D O I
10.1016/0370-2693(92)91400-4
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We calculate the bare S parameter of the standard model at one loop of fermions, using three different regularizations (dimensional, Pauli-Villars and lattice) and find an extra contribution to the bare S parameter besides the standard one for each case. This shows that the extra contribution recently reported for the lattice regularization is not necessarily tied to the non-decoupling effect of fermion doublers.
引用
收藏
页码:437 / 440
页数:4
相关论文
共 50 条
  • [1] Flavor dependence of the S-parameter
    Di Chiara, Stefano
    Pica, Claudio
    Sannino, Francesco
    PHYSICS LETTERS B, 2011, 700 (3-4) : 229 - 235
  • [2] MICROSTRIP AND S-PARAMETER DESIGN
    SMITH, SAC
    ELECTRONICS & WIRELESS WORLD, 1987, 93 (1619): : 885 - 887
  • [3] On peculiarities of S-parameter measurements
    Rolain, Yves
    Van Moer, Wendy
    Jargon, Jeffrey A.
    DeGroot, Donald C.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2007, 56 (05) : 1967 - 1972
  • [4] Performing S-parameter measurements
    Sundberg, G
    MICROWAVES & RF, 2001, 40 (06) : 99 - 100
  • [5] Passivity Check of S-Parameter Descriptor Systems via S-Parameter Generalized Hamiltonian Methods
    Zhang, Zheng
    Wong, Ngai
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2010, 33 (04): : 1034 - 1042
  • [6] Holographic technicolor models and their S-parameter
    Mintakevich, Oded
    Sonnenschein, Jacob
    JOURNAL OF HIGH ENERGY PHYSICS, 2009, (07):
  • [7] Broadband noise parameter and S-parameter measurement technique
    Schmatz, ML
    Baechtold, W
    1997 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS I-III: HIGH FREQUENCIES IN HIGH PLACES, 1997, : 1443 - 1446
  • [8] True multiport S-parameter measurements
    不详
    MICROWAVE JOURNAL, 1997, 40 (10) : 140 - &
  • [9] Verification concepts in S-parameter measurements
    Mubarak, F.
    Zeier, M.
    Hoffmann, J.
    Ridler, N. M.
    Salter, M. J.
    Kuhlmann, K.
    2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016), 2016,
  • [10] ACD estimation of the S-parameter revisited
    Ignjatovic, SR
    Takeuchi, T
    Wijewardhana, LCR
    PHYSICS LETTERS B, 1997, 401 (3-4) : 287 - 293