共 28 条
- [21] Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2 Journal of the Optical Society of America A: Optics and Image Science, and Vision, 1996, 13 (04):
- [23] DETERMINATION OF THE COMPLEX DIELECTRIC FUNCTION OF SI(111) 2X1 GAAS(110) AND GAP(110) SURFACES BY POLARIZED SURFACE DIFFERENTIAL REFLECTIVITY PHYSICA SCRIPTA, 1988, 38 (02): : 199 - 203
- [28] Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2024, 130 (09):