MICROSCOPIC THEORY OF DRIVING FORCE IN ELECTROMIGRATION

被引：82
作者：
SHAM, LJ [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
来源：
PHYSICAL REVIEW B | 1975年 / 12卷 / 08期
关键词：
D O I：
10.1103/PhysRevB.12.3142
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：3142 / 3149
页数：8
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