Piezo-electric tuning fork tip-sample distance control for near field optical microscopes

被引：111

作者：

Karrai, K ^{[1
]}

Grober, RD ^{[1
]}

机构：

[1] YALE UNIV,DEPT APPL PHYS,NEW HAVEN,CT 06520

来源：

ULTRAMICROSCOPY | 1995年 / 61卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(95)00104-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In a recent paper [Karrai and Grober, Appl. Phys. Lett. 66 (1995) 1842], a new technique was developed in order to control the distance separation between a tapered metal-coated optical fiber tip and the surface of a sample. This new technique is based on a piezo-electric tuning fork used as a shear-force detector. The fiber tip, which is attached along one of the arms of the tuning fork, acts as a shear-force pick-up. We present in this article the idealized model analysis that leads to the design parameters of a tuning fork optimized for near-field scanning optical microscopy.

引用

页码：197 / 205

页数：9

共 6 条

[1] COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].