TOTAL-REFLECTION XRF ANALYSIS OF IMPURITIES IN ICE

被引：2

作者：

ARENA, LE ^{[1
]}

SANCHEZ, HJ ^{[1
]}

NASELLO, O ^{[1
]}

机构：

[1] UNIV NACL CORDOBA,FAC MATEMAT ASTRON & FIS,RA-5000 CORDOBA,ARGENTINA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 100卷 / 01期

关键词：

D O I：

10.1016/0168-583X(95)00378-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this work, the Total-Reflection X-Ray Fluorescence Analysis technique, induced by Synchrotron Radiation (SRTRA), was used to determine traces of elements in ice bicrystals. Samples were obtained from a 10(-2) M water solution of HOK. The concentrations of K (Z = 19) in small volumes (< 5 mu l) of the ice bicrystals were measured. With these values of concentration the effective distribution coefficient K-eff was estimated.

引用

页码：196 / 198

页数：3

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