STUDY OF THE COMPOSITION OF ZIRCONIUM-BASED CHROMIUM FREE CONVERSION LAYERS ON ALUMINUM

被引：53

作者：

SCHRAM, T ^{[1
]}

GOEMINNE, G ^{[1
]}

TERRYN, H ^{[1
]}

VANHOOLST, W ^{[1
]}

VANESPEN, P ^{[1
]}

机构：

[1] UNIV ANTWERP,MITAC,B-2610 WILRIJK,BELGIUM

来源：

TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING | 1995年 / 73卷

关键词：

D O I：

10.1080/00202967.1995.11871066

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The composition of chromium free conversion layers on aluminium, based on zir conium has been determined using complementary surface analytical techniques: SEM, AES, XPS, SIMS. The zirconium based chromiu,m free conversion layer consists of a two layered structure, with total thickness less than 10 nm, in which the bottom layer contains only Al and O, while the top layer contains also a fluorinated zirconium compound and probably a polymer that is concentrated towards the outer surface. In a second part the influence of the conversion time on the thickness of the film was studied using AES, SE and EIS. It is concluded that the zirconium based conversion layers are formed within ten seconds and a successive increase in conversion time results only in a very slight thickening of the layer.

引用

页码：91 / 95

页数：5

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