MEASUREMENT OF THIN FERROMAGNETIC FILM PARAMETERS BY A TORQUE ANISOMETER

被引:0
|
作者
RAVLIK, AG
SAMOFALOV, VN
POTAPOV, SV
KOSTENKO, AV
机构
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The procedure determines the saturation magnetization and perpendicular anisotropy constant of a thin ferromagnetic film from a single series of torque moments acting on a film suspended vertically in a magnetic field. It is more accurate than other available procedures. The magnetization can be measured without determining the film volume.
引用
收藏
页码:673 / 676
页数:4
相关论文
共 50 条
  • [1] Phase difference measurement of microwave signals on a thin ferromagnetic film
    Gura, K.N.
    Mkheyan, M.F.
    Repa, F.M.
    Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika, 2001, 44 (08): : 78 - 80
  • [2] MEASUREMENT OF HYSTERESIS MAGNETIZING ANGLES IN THIN PERMALLOY FILMS ON MAGNETIC ANISOMETER
    ZUBAKIN, AM
    VTYURIN, NI
    ARNOLD, OP
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1969, (01): : 129 - &
  • [3] Electromagnetic parameters measurement for thin film materials
    Wu, Yunqiu
    Tang, Zongxi
    Zhang, Biao
    He, Xi
    2008 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, VOLS 1-4, 2008, : 627 - 629
  • [4] Scanning spectrometer of ferromagnetic resonance for analysis of the thin magnetic film parameters
    Belyaev, B.A.
    Izotov, A.V.
    Leksikov, A.A.
    Zavodskaya Laboratoriya. Diagnostika Materialov, 2001, 67 (09): : 24 - 33
  • [5] Torque Magnetometry: Toward Measurement of Quantum Magnetism on Thin Film Heterostructures
    Kong, Minsik
    Ok, Jong Mok
    Sohn, Changhee
    JOURNAL OF THE KOREAN MAGNETICS SOCIETY, 2022, 32 (06): : 229 - 232
  • [6] Magnetostriction Measurement of a Ferromagnetic Thin Film Using Digital Holographic Microscope
    Jen, Shien-Uang
    Liu, Chi-Ching
    Chen, Shin-Ting
    IEEE TRANSACTIONS ON MAGNETICS, 2014, 50 (11)
  • [7] An improved measurement configuration for determining the permeability of ferromagnetic thin film materials
    Wu, Y.
    Tang, Z.
    Xu, Y.
    Zhang, B.
    JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2008, 22 (2-3) : 343 - 352
  • [8] DETERMINATION OF MAGNETIC PARAMETERS IN MAGNETIC THIN-FILMS BY TORQUE MEASUREMENT
    TEJEDOR, M
    FERNANDEZ, A
    HERNANDO, B
    IEEE TRANSACTIONS ON MAGNETICS, 1988, 24 (02) : 1995 - 1997
  • [9] MEASUREMENT OF THIN-FILM PARAMETERS WITH A PRISM COUPLER
    ULRICH, R
    TORGE, R
    APPLIED OPTICS, 1973, 12 (12): : 2901 - 2908
  • [10] Study on optical thin film parameters measurement method
    Science and Technology on Surface Engineering Laboratory, Lanzhou Institute of Space Technology and Physics, Lanzhou
    730000, China
    Hongwai yu Jiguang Gongcheng Infrared Laser Eng., 3 (1048-1052):