TEP MEASUREMENTS ON VACUUM-EVAPORATED TIN OXIDE THIN-FILMS

被引：0

作者：

KUMAR, JS

RAO, SG

RAO, UVS

机构：

[1] Osmania Univ, Hyderabad, India, Osmania Univ, Hyderabad, India

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1987年 / 6卷 / 01期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：25 / 28

页数：4

共 15 条

[1]

BARUA K, 1976, INDIAN J PURE AP PHY, V14, P496

[2] SIZE AND TEMPERATURE EFFECTS ON THERMOELECTRIC-POWER OF BETA-TIN THIN-FILMS [J].

DAS, VD ;

MOHANTY, JC .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (02) :977-981

[3]

DASDAMODARA V, 1983, J APPL PHYS, V54, P6611

[4]

Dutta C. R., 1985, Indian Journal of Physics, Part A, V59A, P59

[5]

Dutta C. R., 1983, Indian Journal of Physics, Part A, V57A, P338

[6]

JAIN DK, 1980, INDIAN J PURE AP PHY, V18, P842

[7]

KHAN MSR, 1982, INDIAN J PURE AP PHY, V20, P656

[8] DIELECTRIC AND ELECTRICAL-PROPERTIES OF SNO2, SB2O3, AND THEIR MIXED FILMS [J].

KUMAR, JS ;

NARAYANA, G ;

SHEKAR, MC ;

RAO, UVS ;

BABU, VH .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1983, 78 (02) :647-653

[9] ELECTRONIC-STRUCTURE FOR A-ZNSE [J].

LIM, PK ;

BRODIE, DE .

CANADIAN JOURNAL OF PHYSICS, 1977, 55 (19) :1641-1647

[10]

MORIN FJ, 1953, PHYS REV, V93, P1195

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