CARRIER CONCENTRATION AND MINORITY CARRIER LIFETIME MEASUREMENT IN SEMICONDUCTOR EPITAXIAL LAYERS BY MOS CAPACITANCE METHOD

被引：54
作者：
JUND, C
机构：
来源：
SOLID-STATE ELECTRONICS | 1966年 / 9卷 / 04期
关键词：
D O I：
10.1016/0038-1101(66)90061-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：315 / &
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