共 50 条
- [46] CHARACTERIZATION OF GA1-XALXAS/GAAS SUPERLATTICES AND THIN SINGLE LAYERS BY X-RAY-DIFFRACTION PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 105 (01): : 197 - 205
- [48] A SIMPLE METHOD OF OBTAINING CONCENTRATION DEPTH-PROFILES FROM X-RAY-DIFFRACTION JOURNAL OF METALS, 1984, 36 (07): : 67 - 67
- [49] A SIMPLE METHOD OF EXAMINING X-RAY-DIFFRACTION LINE BROADENING BY THE USE OF VOIGT FUNCTIONS INDUSTRIAL LABORATORY, 1986, 52 (08): : 742 - 744
- [50] X-RAY-DIFFRACTION CHARACTERIZATION OF MULTILAYER SEMICONDUCTOR STRUCTURES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06): : 3153 - 3159