STUDY OF DISLOCATIONS IN HIGHLY IN DOPED GAAS CRYSTALS GROWN BY LIQUID ENCAPSULATION CZOCHRALSKI TECHNIQUE

被引:16
作者
PICHAUD, B [1 ]
BURLEDURBEC, N [1 ]
MINARI, F [1 ]
DUSEAUX, M [1 ]
机构
[1] LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
关键词
D O I
10.1016/0022-0248(85)90373-2
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:648 / 654
页数:7
相关论文
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