SYNCHROTRON X-RADIATION TOPOGRAPHY

被引：0
|
作者：
TANNER, BK [1 ]
BOWEN, DK [1 ]
机构：
[1] UNIV WARWICK,DEPT ENGN,COVENTRY CV4 7AL,W MIDLANDS,ENGLAND
来源：
MATERIALS SCIENCE REPORTS | 1992年 / 8卷 / 08期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The application of synchrotron radiation for X-ray topography is reviewed. For two types of experiment, dynamic studies and statistical surveys, the intensity and continuous spectrum of synchrotron radiation is particularly important but it is shown that the time structure and time can also be exploited. The future potential of the technique is discussed.
引用
收藏
页码：369 / 407
页数：39
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