SCANNED LIGHT-PULSE TECHNIQUE FOR THE INVESTIGATION OF INSULATOR SEMICONDUCTOR INTERFACES

被引：61
作者：
ENGSTROM, O
CARLSSON, A
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 09期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.332752
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5245 / 5251
页数：7
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