INVESTIGATION OF SPECTRA OF LIGHT REFLECTED OFF CDXHG1-XTE THIN-FILMS

被引：8

作者：

IGNATOWICZ, SA

KISIEL, A

ZIMNAL, M

机构：

[1] SCI & PROD CTR SEMICONDUCTORS, INST ELECTR TECHNOL, WARSAW, POLAND

[2] JAGELLONIAN UNIV, INST PHYS, CRACOW, POLAND

来源：

THIN SOLID FILMS | 1974年 / 21卷 / 02期

关键词：

D O I：

10.1016/0040-6090(74)90109-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：231 / 236

页数：6

共 14 条

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[5] OPTICAL PROPERTIES OF EPITAXIAL FILMS OF CDCHIHG1-CHITE [J].

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PAUL, W .

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[6] ELECTROREFLECTANCE MEASUREMENTS ON CDXHG1-XTE [J].

MORITANI, A ;

TANIGUCHI, K ;

HAMAGUCHI, C ;

NAKAI, J ;

UEDA, R ;

OHTSUKI, O ;

UEDA, Y .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1971, 31 (03) :945-+

[7] CRITICAL POINTS AND LATTICE VIBRATION SPECTRA [J].

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[8] OPTICAL PROPERTIES OF AMORPHOUS 3-5 COMPOUNDS .1. EXPERIMENT [J].

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ZIMMERER, G .

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1972, 49 (02) :513-+

[9]

SZUMMER A, 1971, ELECTRON TECHNOL, V4, P227

[10]

TAUC J, 1965, 1964 P INT C PHYS NO, P606

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