ELECTROCHEMICALLY INDUCED SURFACE-ROUGHNESS ON AU(100) STUDIED BY SURFACE X-RAY-DIFFRACTION

被引：11

作者：

ROBINSON, KM ^{[1
]}

ROBINSON, IK ^{[1
]}

OGRADY, WE ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

ELECTROCHIMICA ACTA | 1992年 / 37卷 / 12期

关键词：

AU(100) ELECTROCHEMISTRY; SURFACE STRUCTURE; SURFACE DIFFRACTION; SYNCHROTRON RADIATION;

D O I：

10.1016/0013-4686(92)85107-V

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The surface of an electropolished Au(100) single crystal has been investigated by synchrotron X-ray diffraction. The crystal was examined after having swept the potential into the double layer of the oxide and hydrogen regions. The results show that there is very little change in the surface atomic roughness from the double layer through the oxide region. When cycled into the hydrogen region, where minimal H-2 production is measured, the surface becomes very rough. No evidence for inducing the (5 x 20) hexagonal reconstruction was observed.

引用

页码：2169 / 2172

页数：4

共 12 条

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