ATOMIC-STRUCTURE OF GRAIN-BOUNDARIES IN SEMICONDUCTORS STUDIED BY ELECTRON-MICROSCOPY (ANALOGY AND DIFFERENCES WITH SURFACES)

被引：58

作者：

BOURRET, A ^{[1
]}

BACMANN, JJ ^{[1
]}

机构：

[1] CEN,SRM,DEPT MET,F-38041 GRENOBLE,FRANCE

来源：

SURFACE SCIENCE | 1985年 / 162卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(85)90940-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：495 / 509

页数：15

共 28 条

[1]

[Anonymous], 2012, CRYSTAL DEFECTS CRYS

[2] STUDY OF INTRINSIC INTERGRANULAR DISLOCATIONS BY CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPY [J].

BACMANN, JJ .

JOURNAL DE PHYSIQUE, 1982, 43 (NC-6) :93-102

[3] SECONDARY DISLOCATION IN HIGH ANGLE TILT BOUNDARIES OF GERMANIUM BICRYSTALS [J].

BACMANN, JJ ;

MILLIER, JP ;

PETIT, M ;

SILVESTRE, G .

MATERIALS RESEARCH BULLETIN, 1980, 15 (02) :261-268

[4] ARE THE CORE STRUCTURES OF DISLOCATIONS AND GRAIN-BOUNDARIES RESOLVABLE BY HREM [J].

BOURRET, A ;

THIBAULTDESSEAUX, J ;

DANTERROCHES, C ;

PENISSON, JM ;

DECRECY, A .

JOURNAL OF MICROSCOPY-OXFORD, 1983, 129 (MAR) :337-345

[5]

BOURRET A, I PHYS C SER

[6] ATOMIC-STRUCTURE OF [011] AND [001] NEAR-COINCIDENT TILT BOUNDARIES IN GERMANIUM AND SILICON [J].

DANTERROCHES, C ;

BOURRET, A .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 49 (06) :783-807

[7]

FRANKL DR, 1967, ELECTRICAL PROPERTIE

[8] THE VARIATION OF GRAIN-BOUNDARY STRUCTURAL WIDTH WITH MISORIENTATION ANGLE AND BOUNDARY PLANE [J].

HAGEGE, S ;

CARTER, CB ;

COSANDEY, F ;

SASS, SL .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 45 (04) :723-740

[9] SOLITONS AND THE ELECTRICAL AND MOBILITY PROPERTIES OF DISLOCATIONS IN SILICON [J].

HEGGIE, M ;

JONES, R .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1983, 48 (04) :365-377

[10] DEUTERIUM PASSIVATION OF GRAIN-BOUNDARY DANGLING BONDS IN SILICON THIN-FILMS [J].

JOHNSON, NM ;

BIEGELSEN, DK ;

MOYER, MD .

APPLIED PHYSICS LETTERS, 1982, 40 (10) :882-884

← 1 2 3 →