Acceptance sampling plans based on truncated life tests for Burr type X distribution

被引：13

作者：

Hu, Min ^{[1
]}

Gui, Wenhao ^{[2
]}

机构：

[1] Beijing Informat Sci & Technol Univ, Sch Informat Management, Beijing 100192, Peoples R China

[2] Univ Minnesota Duluth, Dept Math & Stat, Duluth, MN 55812 USA

来源：

JOURNAL OF STATISTICS & MANAGEMENT SYSTEMS | 2018年 / 21卷 / 03期

关键词：

Acceptance sampling plan; operating characteristic function value; manufacturer's risk; truncated lifetime test; Burr type X distribution;

D O I：

10.1080/09720510.2017.1413044

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

In this paper, we consider acceptance sampling plans for the Burr type X distribution under a truncated lifetime test. For various confidence levels, acceptance numbersand the ratio values of the experimental time to the given and specified median life, the smallest sample size required to insure a certain median lifetime are obtained. The operating characteristic function and the associated manufacturer's risks are also proposed. We illustrate the acceptance sampling plans with a real numerical example.

引用

页码：323 / 335

页数：13

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