MICROWAVE CAVITY PERTURBATION TECHNIQUE .1. PRINCIPLES

被引：224

作者：

KLEIN, O

DONOVAN, S

DRESSEL, M

GRUNER, G

机构：

[1] UNIV CALIF LOS ANGELES,DEPT PHYS,LOS ANGELES,CA 90024

[2] UNIV CALIF LOS ANGELES,CTR SOLID STATE SCI,LOS ANGELES,CA 90024

来源：

INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 1993年 / 14卷 / 12期

关键词：

ELECTRODYNAMIC RESPONSE; SURFACE IMPEDANCE; MICROWAVE CAVITY PERTURBATION THEORY;

D O I：

10.1007/BF02086216

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This report reviews the analysis used to extract the complex conductivity of a compound from a microwave cavity perturbation measurement. We intend to present a generalized treatment valid for any spheroidally shaped sample of arbitrary conductivity which is placed at either the electric or magnetic field antinode of the cavity. To begin with, we establish the relationship between the measured parameters and the conductivity for a spherical sample. Next, we extend these results to the case of spheroids; and for the first time, we cover all different configurations that one can possibly use to study an arbitrary conducting sample inside a cavity: in particular, all possible orientations of the sample with respect to the applied field are solved.

引用

页码：2423 / 2457

页数：35

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