ANALYTICAL BEHAVIOR OF THE SURFACE-CHARGE DENSITY ON A CONDUCTOR WITH 2 CONSECUTIVE EDGES WITH RIGHT ANGLES - COMMENT

被引：0
作者：
LIN, WG
机构：
[1] University of Electrical Science and Technology of China, Chengdu
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 1994年 / 7卷 / 04期
关键词：
D O I：
10.1002/mop.4650070415
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：212 / 213
页数：2
相关论文
共 4 条
  • [1] Olyslager, De Zutter, Analytical Behavior of the Surface Charge Density on a Conductor with Two Consecutive Edges with Right Angles, Microwave Opt. Technol. Lett., 6, 10, pp. 578-581, (1993)
  • [2] Binns K.J., Lawrenson P.J., Analysis and Compulation of Electric and Magnetic Field Problems, (1963)
  • [3] Smyth W.R., pp. 917-920, (1956)
  • [4] Yang, Omar A.S., Rigorous Analysis of Iris Coupling Problem in Waveguide, IEEE Trans. Microwave Theory Tech., 41, 2, pp. 349-352, (1993)
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