PHYSICAL CHARACTERIZATION AND MECHANISM OF CONDUCTION IN THIN-FILMS OF ALUMINUM FLUORIDE

被引：8
作者：
BARRIERE, A
DANTO, Y
SALARDENNE, J
机构：
来源：
THIN SOLID FILMS | 1975年 / 26卷 / 02期
关键词：
D O I：
10.1016/0040-6090(75)90142-X
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：273 / 291
页数：19
相关论文
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