共 12 条
- [1] PRECISION LATTICE CONSTANT DETERMINATION [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818
- [3] THERMAL VARIATION APPARATUS FOR X-RAY DIFFRACTION EXPERIMENTS UP TO 3000 K [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (12): : 1222 - +
- [4] APPARATUS FOR X-RAY MEASUREMENTS ON REACTIVE MATERIALS AT 2500 DEGREES C [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (09): : 807 - &
- [5] HORI T, 1977, XSEN BUNSEKI NO SHIN, V9, P35
- [7] NEW MODEL OF BOND DIFFRACTOMETER FOR PRECISE DETERMINATION OF LATTICE-PARAMETERS AND THERMAL-EXPANSION OF SINGLE-CRYSTALS [J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1978, 13 (05): : 561 - 567
- [9] HIGH-TEMPERATURE FURNACE FOR AN X-RAY DIFFRACTOMETER [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (03): : 174 - 176
- [10] SCHOSSBERGER FV, 1967, HDB XRAYS, P14