ELECTRON-BEAM SENSITIVITY AND CONTRAST OF HALOGENATED POLYSTYRENE RESISTS

被引:0
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作者
JENSEN, JE [1 ]
BRAULT, RG [1 ]
MILLER, LJ [1 ]
GRANGER, DD [1 ]
VANAST, CI [1 ]
机构
[1] HUGHES RES LABS,MALIBU,CA 90265
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O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:C233 / C233
页数:1
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