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DETERMINATION OF THICKNESSES OF THE FE, ZR SUBLAYERS IN FE-ZR SUPERLATTICES
被引:23
作者
:
BASZYNSKI, J
论文数:
0
引用数:
0
h-index:
0
机构:
Institute of Molecular Physics, Polish Academy of Sciences, Poznan
BASZYNSKI, J
STOBIECKI, F
论文数:
0
引用数:
0
h-index:
0
机构:
Institute of Molecular Physics, Polish Academy of Sciences, Poznan
STOBIECKI, F
SZYMANSKI, B
论文数:
0
引用数:
0
h-index:
0
机构:
Institute of Molecular Physics, Polish Academy of Sciences, Poznan
SZYMANSKI, B
CHRZUMNICKA, K
论文数:
0
引用数:
0
h-index:
0
机构:
Institute of Molecular Physics, Polish Academy of Sciences, Poznan
CHRZUMNICKA, K
机构
:
[1]
Institute of Molecular Physics, Polish Academy of Sciences, Poznan
来源
:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
|
1994年
/ 141卷
/ 01期
关键词
:
D O I
:
10.1002/pssa.2211410130
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
[No abstract available]
引用
收藏
页码:K23 / K27
页数:5
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IEEE TRANSACTIONS ON MAGNETICS,
1984,
20
(05)
:1296
-1298
[2]
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[3]
DETERMINATION OF THE MASS THICKNESS AND TRUE DENSITY OF VACUUM-DEPOSITED CR FILMS BY X-RAY-FLUORESCENCE
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.
JAPANESE JOURNAL OF APPLIED PHYSICS,
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:2313
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←
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共 3 条
[1]
MAGNETIC-PROPERTIES IN COMPOSITIONALLY MODULATED AMORPHOUS FE(C)/SI ALLOYS
[J].
KAZAMA, NS
论文数:
0
引用数:
0
h-index:
0
机构:
Tohoku Univ, Research Inst for Iron,, Steel & Other Metals, Sendai,, Jpn, Tohoku Univ, Research Inst for Iron, Steel & Other Metals, Sendai, Jpn
KAZAMA, NS
;
FUJIMORI, H
论文数:
0
引用数:
0
h-index:
0
机构:
Tohoku Univ, Research Inst for Iron,, Steel & Other Metals, Sendai,, Jpn, Tohoku Univ, Research Inst for Iron, Steel & Other Metals, Sendai, Jpn
FUJIMORI, H
;
YUITO, I
论文数:
0
引用数:
0
h-index:
0
机构:
Tohoku Univ, Research Inst for Iron,, Steel & Other Metals, Sendai,, Jpn, Tohoku Univ, Research Inst for Iron, Steel & Other Metals, Sendai, Jpn
YUITO, I
;
KRONMULLER, H
论文数:
0
引用数:
0
h-index:
0
机构:
Tohoku Univ, Research Inst for Iron,, Steel & Other Metals, Sendai,, Jpn, Tohoku Univ, Research Inst for Iron, Steel & Other Metals, Sendai, Jpn
KRONMULLER, H
.
IEEE TRANSACTIONS ON MAGNETICS,
1984,
20
(05)
:1296
-1298
[2]
MAISSEL, 1970, HDB THIN FILM TECHNO
[3]
DETERMINATION OF THE MASS THICKNESS AND TRUE DENSITY OF VACUUM-DEPOSITED CR FILMS BY X-RAY-FLUORESCENCE
[J].
SATO, Y
论文数:
0
引用数:
0
h-index:
0
SATO, Y
;
KIMURA, S
论文数:
0
引用数:
0
h-index:
0
KIMURA, S
;
KATSUBE, Y
论文数:
0
引用数:
0
h-index:
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KATSUBE, Y
.
JAPANESE JOURNAL OF APPLIED PHYSICS,
1980,
19
(11)
:2313
-2313
←
1
→