NANOMETER RESOLUTION IN LUMINESCENCE MICROSCOPY OF III-V HETEROSTRUCTURES

被引:144
作者
ABRAHAM, DL
VEIDER, A
SCHONENBERGER, C
MEIER, HP
ARENT, DJ
ALVARADO, SF
机构
[1] IBM Research Division, Zurich Research Laboratory, CH-8803 Rüschlikon
关键词
D O I
10.1063/1.103154
中图分类号
O59 [应用物理学];
学科分类号
摘要
In a scanning tunneling microscope experiment, the luminescence induced by the recombination of holes with electrons tunneling into cleaved (110) GaAs/AlGaAs heterostructures is used to image the interface region with nanometer resolution.
引用
收藏
页码:1564 / 1566
页数:3
相关论文
共 17 条
[1]  
ABRAHAM DJ, UNPUB
[2]  
ALBREKTSEN O, UNPUB
[3]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[4]   PHOTON-EMISSION EXPERIMENTS WITH THE SCANNING TUNNELLING MICROSCOPE [J].
COOMBS, JH ;
GIMZEWSKI, JK ;
REIHL, B ;
SASS, JK ;
SCHLITTLER, RR .
JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :325-336
[5]  
DAVIDSON SM, 1977, J MICROSC-OXFORD, V110, P177, DOI 10.1111/j.1365-2818.1977.tb00032.x
[6]  
DAVIDSON SM, 1980, J MICROSCOPY, V118, P175
[7]   SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].
GERBER, C ;
BINNIG, G ;
FUCHS, H ;
MARTI, O ;
ROHRER, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224
[8]   PHOTON-EMISSION WITH THE SCANNING TUNNELING MICROSCOPE [J].
GIMZEWSKI, JK ;
REIHL, B ;
COOMBS, JH ;
SCHLITTLER, RR .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1988, 72 (04) :497-501
[9]   TRANSPORT PROPERTIES OF GAAS OBTAINED FROM PHOTOEMISSION MEASUREMENTS [J].
JAMES, LW ;
MOLL, JL .
PHYSICAL REVIEW, 1969, 183 (03) :740-&
[10]   LOW-THRESHOLD ELECTRICALLY PUMPED VERTICAL-CAVITY SURFACE-EMITTING MICROLASERS [J].
JEWELL, JL ;
SCHERER, A ;
MCCALL, SL ;
LEE, YH ;
WALKER, S ;
HARBISON, JP ;
FLOREZ, LT .
ELECTRONICS LETTERS, 1989, 25 (17) :1123-1124